Dear Colleagues: The OOF team at NIST is proud to announce the release of OOF2 version 2.0.0, for performing image-based finite element analysis of material microstructures. This is the first *non* beta release of OOF2. It can be downloaded from the OOF website at http://www.ctcms.nist.gov/oof/oof2.html Complete installation instructions are on the web page and in the README file inside the source distribution. Version 2.0.0 includes a number of improvements over the last beta release, 2.0.beta8. A large number of mostly minor bugs have been fixed, and overall program stability is much improved. 2.0.0 includes two test suites, in the directories TEST and TEST/GUI. The README files in those directories explain how to run the test suites. Please send bug reports to oof_bugs@ctcms.nist.gov, and other questions and feedback to oof_manager@ctcms.nist.gov. We are always happy to hear how people are using OOF, and welcome suggestions for future development. Sincerely, The NIST OOF team Andrew Reid Rhonald Lua Steve Langer Seung-Ill Haan (emeritus) Edwin Garcia (emeritus)