Nanofilled Polymer Melts
Background
Fillers have long been used in industry to improve the properties of polymer
materials. "Nano-particles", such as gold particles, silica beads or silicate
nano-particles, fullerenes and nanotubes, silsesquioxanes, and others influence
material properties at molecular scales, and have the potential to be far
more homogeneously distributed, and hence less material is needed for changes
to bulk properties, keeping costs down. The eventual goal of this project
is to understand the mechanism by which nano-fillers improve material properties,
and thereby aid in measurement and development of new materials.
Approach
Simulation of filled polymer melts poses a particular challenge, since
it is necessary to understand the system over a wide range of length scales.
At the atomistic level, one needs to understand the effects of the interactions
and geometry of nano-particles on the surrounding polymer, while at mesoscopic
length scales, the distribution and dynamic clustering of the nano-particles
becomes very important. Finally, from this information, one wants to understand
the resulting changes in the overall mechanical properties. As a result,
our research approaches the problem from 3 angles:
Molecular dynamics simulations of the atomistic properties yielding the
dynamic and structural changes induced by a nanoscopic particle, on the
surrounding melt. This effort includes simulations of both symmetric
and tube nanoparticles.
Mesoscale simulations via lattice Boltzmann, hydrodynamic lattice-gas,
and dissipative particle dynamics techniques to probe the phase behavior
and dynamic clustering of nano-particles
Using the configurations generated from meso-scale simulations, we study
the mechanical properties using OOF (Object-Oriented Finite-Element), a
general purpose tool designed in the CTCMS for studying mechanical properties.
Working Group:
Bruce Boghosian (Tufts)
Martin Chiang (NIST)
Jack Douglas (NIST)
Yeshitela Gebremichael (U. Maryland/Michigan)
Sharon Glotzer (U. Michigan)
Charles Han (NIST)
Steve Langer (NIST)
Nita Parekh (NIST)
Francis Starr (NIST)